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    AuthorRoss, Kirk Campbell (1)SubjectRietveld method (1)X-ray crystallography Technique (1)X-rays Diffraction Data processing (1)... View MoreDate Issued
    2000 (1)
    Discipline
    Geology (1)

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    X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites 

    Ross, Kirk Campbell (2000)
    This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues ...

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