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    AuthorChiu, Kwok-Tung (1)Subject
    Dielectrics (1)
    Interferometers (1)
    ... View MoreDate Issued1974 (1)xmlui.ArtifactBrowser.AdvancedSearch.type_disciplinePhysics (1)

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    Microwave interferometer for measuring dielectric properties of low-loss solids 

    Chiu, Kwok-Tung (1974)
    An X-band microwave bridge-interferometer is constructed for measuring the permittivity of solids. Using simple theory, the system is first tested with several materials of known permittivity (e.g. ertalon, plexiglas ...

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