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Microwave interferometer for measuring dielectric properties of low-loss solids
(1974)
An X-band microwave bridge-interferometer is constructed for measuring
the permittivity of solids. Using simple theory, the system is first tested
with several materials of known permittivity (e.g. ertalon, plexiglas ...
Diffusion of impurities from ion implants in silicon
(1974)
The use of shallow single and double impurity ion implants
as diffusion sources was studied on bare (111) silicon wafers
implanted at room temperature with 45 KeV boron, phosphorus and
arsenic. The samples were diffused ...