X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites
dc.contributor.advisor | Mitchell, Roger H. | |
dc.contributor.author | Ross, Kirk Campbell | |
dc.date.accessioned | 2017-06-05T19:24:35Z | |
dc.date.available | 2017-06-05T19:24:35Z | |
dc.date.created | 2000 | |
dc.date.issued | 2000 | |
dc.identifier.uri | http://knowledgecommons.lakeheadu.ca/handle/2453/1765 | |
dc.description.abstract | This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document) | |
dc.language.iso | en_US | |
dc.subject | X-rays Diffraction Data processing | |
dc.subject | Rietveld method | |
dc.subject | X-ray crystallography Technique | |
dc.title | X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites | |
dc.type | Thesis | |
etd.degree.name | Master of Science | |
etd.degree.level | Master | |
etd.degree.discipline | Geology | |
etd.degree.grantor | Lakehead University |
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