Please use this identifier to cite or link to this item: https://knowledgecommons.lakeheadu.ca/handle/2453/1765
Title: X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites
Authors: Ross, Kirk Campbell
Keywords: X-rays Diffraction Data processing;Rietveld method;X-ray crystallography Technique
Issue Date: 2000
Abstract: This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document)
URI: http://knowledgecommons.lakeheadu.ca/handle/2453/1765
metadata.etd.degree.discipline: Geology
metadata.etd.degree.name: Master of Science
metadata.etd.degree.level: Master
metadata.dc.contributor.advisor: Mitchell, Roger H.
Appears in Collections:Retrospective theses

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