Please use this identifier to cite or link to this item:
https://knowledgecommons.lakeheadu.ca/handle/2453/1765
Title: | X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites |
Authors: | Ross, Kirk Campbell |
Keywords: | X-rays Diffraction Data processing;Rietveld method;X-ray crystallography Technique |
Issue Date: | 2000 |
Abstract: | This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document) |
URI: | http://knowledgecommons.lakeheadu.ca/handle/2453/1765 |
metadata.etd.degree.discipline: | Geology |
metadata.etd.degree.name: | Master of Science |
metadata.etd.degree.level: | Master |
metadata.dc.contributor.advisor: | Mitchell, Roger H. |
Appears in Collections: | Retrospective theses |
Files in This Item:
File | Description | Size | Format | |
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RossK2000m-1b.pdf | 19.3 MB | Adobe PDF | View/Open |
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