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    X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites

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    RossK2000m-1b.pdf (18.84Mb)

    Date

    2000

    Author

    Ross, Kirk Campbell

    Degree

    Master of Science

    Discipline

    Geology

    Subject

    X-rays Diffraction Data processing
    Rietveld method
    X-ray crystallography Technique

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    Abstract

    This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document)

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    http://knowledgecommons.lakeheadu.ca/handle/2453/1765

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