Metrization and sigma bases

dc.contributor.advisor	Whitfield, John
dc.contributor.author	Hansen , Lawrence David
dc.date.accessioned	2009-11-24T20:16:42Z
dc.date.available	2009-11-24T20:16:42Z
dc.date.created	1969
dc.date.issued	1969
dc.identifier.uri	http://knowledgecommons.lakeheadu.ca/handle/2453/33
dc.description	1969	en_US
dc.description.abstract	In this thesis, we use the concept of sigma base to study the metrizability of various topological spaces. Chapter 1 is devoted to the definition of basic terms, a proof of Urysohn's Metrization Theorem, and an introduction to sigma structures.	en_US
dc.language.iso	en	en_US
dc.subject	metrization	en_US
dc.subject	sigma bases	en_US
dc.title	Metrization and sigma bases	en_US
dc.type	Thesis	en_US
etd.degree.name	Master of Arts	en_US
etd.degree.level	Master	en_US
etd.degree.discipline	Mathematical Sciences	en_US
etd.degree.grantor	Lakehead University	en_US
dc.contributor.committeemember	Eames, William