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Metrization and sigma bases

dc.contributor.advisorWhitfield, John
dc.contributor.authorHansen , Lawrence David
dc.date.accessioned2009-11-24T20:16:42Z
dc.date.available2009-11-24T20:16:42Z
dc.date.created1969
dc.date.issued1969
dc.identifier.urihttp://knowledgecommons.lakeheadu.ca/handle/2453/33
dc.description1969en_US
dc.description.abstractIn this thesis, we use the concept of sigma base to study the metrizability of various topological spaces. Chapter 1 is devoted to the definition of basic terms, a proof of Urysohn's Metrization Theorem, and an introduction to sigma structures.en_US
dc.language.isoenen_US
dc.subjectmetrizationen_US
dc.subjectsigma basesen_US
dc.titleMetrization and sigma basesen_US
dc.typeThesisen_US
etd.degree.nameMaster of Artsen_US
etd.degree.levelMasteren_US
etd.degree.disciplineMathematical Sciencesen_US
etd.degree.grantorLakehead Universityen_US
dc.contributor.committeememberEames, William


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