Self-assembled thin films of thiocyanate and selenocyanate bithiophenes
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Kelly, Kaitlyn T.
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Abstract
Presented herein is the organic synthesis and thin film (TF) assembly of six alkyl-substituted
thiocyante and selenocyante bithiophene molecules: NCSe-T2-Hx, NCS-T2-Hx, NCS-Hx-T2-Hx, NCSe-
Hx-T2-Hx, NCS-Hx-T2-Hx-SCN and NCSe-Hx-T2-Hx-SeCN. TFs assembled from these thio and
selenocyanates were characterized by six different techniques: electrochemical capacitance (Cp)
measurements, scanning electron microscopy (SEM), energy dispersive x-ray spectroscopy (EDX),
atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS) and time-of-flight secondary
ion mass spectrometry (ToF-SIMS). Cp experiments were used to confirm the development of TFs on an
amorphous Au surface using ethanol or hexanes as a reaction solvent. A sputtered Au surface was
observed by SEM/EDX to be an inappropriate surface for TF assembly. TFs assembled onto epitaxially
grown Au were characterized by multiple techniques. Large crystallites were observed on TFs assembled
from NCSe-T2-Hx and NCSe-Hx-T2-Hx-SeCN. Chemical maps of these crystallites were obtained
through SEM/EDX. The presence of a covalent Au-S or Au-Se bond on the surface was confirmed by
XPS signals from the S 2p3/2 and Se 3d5/2/3d3/2 regions respectively. XPS signals of ~ 399 eV in the N 1s
region were observed in all assemblies characterized by this technique, indicating the presence of residual
gold-bound cyanide (Au(CN)ads) on the surface. ToF-SIMs chemical intensity maps confirmed the
presence of expected TF fragments on the surface of all TFs characterized by this technique. ToF-SIMS
results suggested that TFs connected to the Au surface through an aromatically bound S or Se atom
produced TFs with higher surface coverage.
Description
Keywords
Thiolate thin film, Development of thiocyanate precursors, Surface analysis techniques, Atomic force microscopy (AFM), Scanning electron microscopy and energy dispersive microscopy (SEM/EDX), X-ray photoelectron spectroscopy (XPS), Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
