X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites

dc.contributor.advisorMitchell, Roger H.
dc.contributor.authorRoss, Kirk Campbell
dc.date.accessioned2017-06-05T19:24:35Z
dc.date.available2017-06-05T19:24:35Z
dc.date.created2000
dc.date.issued2000
dc.description.abstractThis study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document)
dc.identifier.urihttp://knowledgecommons.lakeheadu.ca/handle/2453/1765
dc.language.isoen_US
dc.subjectX-rays Diffraction Data processing
dc.subjectRietveld method
dc.subjectX-ray crystallography Technique
dc.titleX-ray diffraction and Rietveld structural refinement of selected fluoroperovskites
dc.typeThesis
etd.degree.disciplineGeology
etd.degree.grantorLakehead University
etd.degree.levelMaster
etd.degree.nameMaster of Science

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