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https://knowledgecommons.lakeheadu.ca/handle/2453/33| Title: | Metrization and sigma bases |
| Authors: | Hansen , Lawrence David |
| Keywords: | metrization;sigma bases |
| Issue Date: | 1969 |
| Abstract: | In this thesis, we use the concept of sigma base to study the metrizability of various topological spaces. Chapter 1 is devoted to the definition of basic terms, a proof of Urysohn's Metrization Theorem, and an introduction to sigma structures. |
| Description: | 1969 |
| URI: | http://knowledgecommons.lakeheadu.ca/handle/2453/33 |
| metadata.etd.degree.discipline: | Mathematical Sciences |
| metadata.etd.degree.name: | Master of Arts |
| metadata.etd.degree.level: | Master |
| metadata.dc.contributor.advisor: | Whitfield, John |
| metadata.dc.contributor.committeemember: | Eames, William |
| Appears in Collections: | Retrospective theses |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| HansenL1969m-1b.pdf | 3.08 MB | Adobe PDF |  View/Open |
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